N4S / N4 UV-Vis spectrophotometer, combined with ARM processing core, automatic wavelength so that the instrument has a high-end instrument test speed and function. Which can meet the qualitative and quantitative analysis of the vast majority of UV-visible spectral ranges in conventional laboratories. Suitable for medical and health, clinical testing, biochemistry, petrochemical, environmental protection, quality control and tertiary institutions and other departments.

main feature:

● 7-inch color touch screen and patented technology to achieve a simple and effective human-computer interaction at the same time, clearly show the test data and scan results.

● USB communication port and optional UVwin8 UV spectrum software, to achieve data and map processing functions, as well as massive data storage, and for the customer’s secondary development to facilitate.

● Full-band scanning (limited to S), sub-band scanning (limited to S), dynamic time scanning, automatic wavelength, linear regression, concentration direct reading, peak and valley detection, timing printing and other functions.

● advanced power protection measures, you can remember the test data, scan map (limited to S models), regression equations and instrument correction parameters, to achieve rapid initialization.

● With halogen and deuterium lamp life protection.

Optional:

● Built-in thermal printer (N4S only)

UVwin8 UV spectrum software

Other:

● Light source: 12V 20W halogen lamp and long life deuterium lamp

● Power supply voltage: AC220V ± 22V 50Hz ± 1Hz

● Power: 180W

Technical indicators:

● Metering mode: single beam

● Monochromator: self-collimation

● Focal length: 160mm

● Grating: 1200 lines / mm

● Detector: photocell

● Spectral bandwidth: 2nm

● Wavelength setting: Touch screen input

● Wavelength range: 190 – 1100nm

● Wavelength Accuracy: ± 1nm

● Wavelength repeatability: ≤ 0.5nm

● Wavelength scanning speed: fast, medium and slow

● Light source switching wavelength: 340nm

● Stray light: ≤ 0.1% (T) (measured at Nil in 220 nm) (measured at NaNO2 at 360 nm)

● Photometric range: 0.0 ~ 200.0% T

-0.301 ~ 4.000A

0.000 to 9999C

● Photometric accuracy: ± 0.5% T

± 0.004Abs (0 – 0.5A)

± 0.008Abs (0.5 – 1A)

● Photometric repeatability: ≤0.2% T

0.002Abs (0 – 0.5A)

0.004Abs (0.5 -1 A)

● Baseline flatness: ≤ ± 0.003A (limited to S)

● Noise: 100% (T) ≤ 0.2% (T)

0% (T) ≤ 0.1% (T)

Baseline drift: ± 0.004Abs / 0.5h (limited to S)