L7 double beam UV-VIS spectrophotometers (Wavelength Range 190-1100nm, Spectrum Bandwidth 1.8nm) adopt double beam optical system, and blazed holographic gratings.
L7 double beam UV-VIS spectrophotometers using 8-inch color touch-screen, cutting-edge user interface, powerful functions, and easy operation.
L7 double beam UV-VIS spectrophotometers (Wavelength Range 190-1100nm, Spectrum Bandwidth 1.8nm) adopt double beam optical system, and blazed holographic gratings.
L7 double beam UV-VIS spectrophotometers using 8-inch color touch-screen, cutting-edge user interface, powerful functions, and easy operation.
With powerful functions, the equipment shows great performance in qualitative and quantitative testing, such as:
● Full-spectrum scanning
● Linear regression
● Detailed spectrum scanning
● Concentration direct reading
● Time-based kinetics determination
● Peak / Valley detecting
● GOTO λ
● Multi-wavelength measurement
The equipment is designed with sophisticated power protection system. With high capacity of internal memory, it can store testing results, scanned images, regression equations and correction data. Therefore, it follows a fast initialization when power on.
The instrument can be connected with dedicated printer, which can print testing results, or draw curve from spectral scanning, fixed wavelength time-based scanning, and linear regression.
With USB COM port the device can be connected to a PC, which can not only enhance theperformance in data testing and spectrum scanning, but also expand the memory to save more testing results.
Main Features
● Double beam optical system
● 8-inch color touch-screen
● Automatic zero and full scale adjustment
● Automatic wavelength settings
● Equipped with USB COM port
● UV WIN8 Spectrum Data Processing Software optional
● Thermal plotter optional
Main technical parameters:
| Model | L7 |
| Wavelength Range | 190-1100nm |
| Spectrum Bandwidth | 1.8nm |
| Wavelength Accuracy | ± 0.3nm |
| Photometric Range | 0.0 ~ 200.0% T ; -0.301 ~ 4.000A ; 0.000 to 9999C |
| Photometric Accuracy | ± 0.3% T ; ± 0.002Abs (0 – 0.5A) ; ± 0.004Abs (0.5 – 1A) |
| Stray Light | ≤ 0.15% (measured by NaI at 220 nm) (measured at NaNO2 at 360 nm) |
| Photometric Repeatability | ≤ 0.15% T ; 0.001Abs (0 – 0.5A) ; 0.002Abs (0.5 – 1A) |
| Focal Length | 160mm |
| Grating | 1200 lines/mm |
| Detector | Silicon Photocell |
| Noise | 100%(T) noise ≤ 0.15% (T) ; 0% (T) noise ≤ 0.1% (T) |
| Baseline Drift | ± 0.0002 Abs / h (250nm and 500nm after preheat warm up for 2 hours ) |
| COM Port | usb |
| Power | Power |
